TW 2: Advanced SPM, Machine Learning for Microscopy, Biophysics and Data MGN (CSIC, 5 days, Month 18) |
| C5. Quantitative functional SPM nanoscale imaging (CSIC, 1.5 days): Functional vs topographic imaging modes. Nanomechanical mapping (elastic and viscoelastic properties). Nanoelectrical mapping (conductive and dielectric properties). Quantitative functional SPM. CSIC is a world leader in SPM nanomechanical mapping. |
| C6. Machine and Deep Learning in microscopy (UGOT, 1.5 days): The perceptron. Single layer artificial neural networks. Deep and Convolutional neural networks. Selected applications: trajectory prediction, computer vision, feature extraction, classification. UGOT organizes regularly PhD courses on deep learning for microscopy. |
| C7. Mechanical and electrical properties of biologicalsamples (IFJPAN, 1 day): Mechanical and electrical physical magnitudes. Macroscopic and microscopic techniques (rheometry, deformability cytometry, electrophoresis, patch clamp, optical tweezers, SPM). IFJPAN pioneered SPM nanomechanical biomeasurements. |
| N1. FAIR Data Management (IFLAI, 1 day): FAIR data principles: making data findable, how to gain access to them, compatibility with other data, and possible to reuse. FAIR data principles as integral part of the work within open science. IFLAI is and AI based SME and has wide experience in data management training. |
TW 1: Basics of SPM, Machine Learning and BioMicroscopyHosted by Charité and Bruker Nano GmbH (November, 17th- 20nd, 2025) – Coincides with Mid-Term Meeting |
| Underpinning of Machine Learning: History of machine learning. Inference statistics. Introduction to supervised, semisupervised and unsupervised learning. Advanced topics of model learning and model evaluation. Data preparation. Multi-dimensional data. Outlier detection. |
| Microscopy for Life Sciences and Medicine: Basic structures in biological samples. Optical microscopy (bright field, fluorescence, confocal). Electron microscopy (scanning and transmission electron microscopies). Medical imaging techniques (X-Rays, PET, MRI). |
| Introduction to atomic force microscopy imaging: Brief history and principles of SPM. Set-up description. Imaging modes (contact, intermittent contact, non-contact, force-volume). Spectroscopic modes. Application in Life Sciences. Hands on laboratory. |
| Introduction to SPM image processing: Basics of SPM image processing: flattening, equalization, line/spot removal, smoothing, profiling, tip de-convolution. Advanced image processing: volume data, clustering, roughness, nanoparticle detection. Introduction to Gwyddion |
Place: Charité – Universitätsmedizin Berlin, Virchowweg 11, 10117 Berlin and Bruker Nano GmbH, Am Studio 2D, 12489 Berlin.
Attendance: DCs mandatory. Open to non SPM4.0 researchers (limited places).